P. Vianco, M. Holliday, M. Neilsen, R. Sorensen, B. B. Yang, A. Kilgo, J. Rejent, M. Grazier, J. Johnson, J. Granata
{"title":"Use of the TurboSiP© software to predict the long-term reliability of solder joints on photovoltaic systems","authors":"P. Vianco, M. Holliday, M. Neilsen, R. Sorensen, B. B. Yang, A. Kilgo, J. Rejent, M. Grazier, J. Johnson, J. Granata","doi":"10.1109/PVSC.2013.6745099","DOIUrl":null,"url":null,"abstract":"The TurboSiP© software predicts the thermal mechanical fatigue (TMF) of commonly used solder joints. The input parameters are package materials, interconnection design, solder alloy (Sn-Pb or Pb-free), and the environment. This computational tool was used to predict the TMF lifetime of (a) collector circuit solder joints used in photovoltaic solar panel systems as well as (b) 1206 chip capacitor and (c) 14 I/O SOIC package solder joints on the printed circuit boards of the inverter module. All interconnections were analyzed as having the eutectic Sn-Pb solder. A service temperature cycle was defined from data logger parameters. Accelerated aging test conditions were also evaluated in the software. The TurboSiP© predicted lifetimes for the collector circuit as well as convention component solder joints that were more-than-adequate to meet the customer's requirements.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"165 1","pages":"3029-3032"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2013.6745099","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
使用TurboSiP©软件预测光伏系统焊点的长期可靠性
TurboSiP©软件预测常用焊点的热机械疲劳(TMF)。输入参数包括封装材料、互连设计、焊料合金(Sn-Pb或无pb)和环境。该计算工具用于预测(a)光伏太阳能电池板系统中使用的集电极电路焊点以及(b) 1206片式电容器和(c)逆变模块印刷电路板上的14 I/O SOIC封装焊点的TMF寿命。所有连接处均采用共晶Sn-Pb焊料进行分析。根据数据记录器参数定义了一个服务温度周期。在软件中对加速老化试验条件进行了评价。TurboSiP©预测集电极电路和常规元件焊点的使用寿命足以满足客户的要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。