Performance evaluation of multi-gate fets using the BSIM-CMG model

Neelam Patil, C. G. Martin, E. Oruklu
{"title":"Performance evaluation of multi-gate fets using the BSIM-CMG model","authors":"Neelam Patil, C. G. Martin, E. Oruklu","doi":"10.1109/EIT.2014.6871772","DOIUrl":null,"url":null,"abstract":"In this paper, different multi-gate transistor configurations are analyzed using the BSIM-CMG model with emphasis on performance scaling with parameter changes. We examine the effect of key parameters on the leakage current, delay and dynamic power for basic logic gates and the mirror adder. Simulation results indicate a linear increase in the leakage current and the dynamic power with increasing number of fins. On the other hand, with larger number of gates, the static current decreases. Minimum static power dissipation can be achieved with high number of gates and a lesser number of fins.","PeriodicalId":92209,"journal":{"name":"IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology","volume":"25 1","pages":"256-259"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIT.2014.6871772","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

In this paper, different multi-gate transistor configurations are analyzed using the BSIM-CMG model with emphasis on performance scaling with parameter changes. We examine the effect of key parameters on the leakage current, delay and dynamic power for basic logic gates and the mirror adder. Simulation results indicate a linear increase in the leakage current and the dynamic power with increasing number of fins. On the other hand, with larger number of gates, the static current decreases. Minimum static power dissipation can be achieved with high number of gates and a lesser number of fins.
基于BSIM-CMG模型的多栅极场效应管性能评价
本文采用BSIM-CMG模型分析了不同的多栅极晶体管结构,重点研究了其性能随参数变化的变化规律。研究了关键参数对基本逻辑门和镜像加法器漏电流、延时和动态功率的影响。仿真结果表明,随着翅片数量的增加,泄漏电流和动态功率呈线性增加。另一方面,栅极数目越大,静态电流越小。最小的静态功耗可以实现与高数量的门和较少数量的鳍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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