60 GHz imaging of panels for defect detection using planar scanning

Abstract

This paper presents imaging results of measurements conducted at 60 GHz, using the planar rectangular near-field technique. Utilizing the stated techniques at higher frequencies enables detection of smaller defects, and allows for a small measurement set-up in a laboratory environment. An algorithm based on the Fast Fourier Transform (FFT) has been developed in order to process the data. The paper provides measurement results for an illustrative panel, which show clear detection of the distributed defects. The purpose of this work is to enable processing of recent data from measurements of industrial composite panels.