S. Salahuddin, M. Perumkunnil, E. Litta, A. Gupta, P. Weckx, J. Ryckaert, M. Na, A. Spessot
{"title":"Buried power SRAM DTCO and system-level benchmarking in N3","authors":"S. Salahuddin, M. Perumkunnil, E. Litta, A. Gupta, P. Weckx, J. Ryckaert, M. Na, A. Spessot","doi":"10.1109/VLSITechnology18217.2020.9265076","DOIUrl":null,"url":null,"abstract":"The increased metal resistance degrades both the performance and write margin of SRAM circuits in sub-10nm nodes. This paper utilizes buried power distribution as SRAM performance and write ability booster in 3nm node. BPR-SRAM offers up to 34.5% read speed and 498.6mV write margin improvement over conventional SRAM. Gem5 system simulator predicts up to 28.2% performance gain with server-processor having BPR-SRAM in L2 and L3 cache as compared to the baseline.","PeriodicalId":6850,"journal":{"name":"2020 IEEE Symposium on VLSI Technology","volume":"20 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSITechnology18217.2020.9265076","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
The increased metal resistance degrades both the performance and write margin of SRAM circuits in sub-10nm nodes. This paper utilizes buried power distribution as SRAM performance and write ability booster in 3nm node. BPR-SRAM offers up to 34.5% read speed and 498.6mV write margin improvement over conventional SRAM. Gem5 system simulator predicts up to 28.2% performance gain with server-processor having BPR-SRAM in L2 and L3 cache as compared to the baseline.