Hybrid 3D Package with RDL and Laminate Substrate for Ultra-Thin and High-Bandwidth Applications

Jaeyoon Kim, Kyeryung Kim, Eunyoung Lee, S. Hong, JuHong Shin, MinKeon Lee, Ji Hun Lee, David Hiner, Wonchul Do
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Abstract

In this work, a hybrid 3D package combining a redistribution layer (RDL) and laminate substrate layer for ultra-thin and high-bandwidth mobile applications are discussed and demonstrated. The motivation behind this hybrid 3D package structure was leveraging the advantages of high density RDL layer and advanced laminate substrate layer in one package to optimize package features or performance in bandwidth, package height, assembly manufacturing and package level as well as board level reliability to each specific industry requirement. For demonstration purposes, a $12.5\times 12.5-\text{mm}$ hybrid 3D packages combining a high density RDL and advanced laminate-substrate layer were designed and manufactured. In this demonstration, the $12.5\times 12.5-\text{mm}$ hybrid 3D package showed $395\ \mu \mathrm{m}$ package height including ball grid array (BGA) solder ball height and package warpage of $+64\ \mu \mathrm{m}$ (in crying mode) at 25°C and $-81\ \mu \mathrm{m}$ (in smile mode) at 260°C. The demonstration package passed package level reliability tests including unbiased highly accelerated stress test (uHAST), temperature cycling (TC) test and high temperature storage (HTS) test. The package showed less creep strain energy density (CSED) of the BGA solder balls under board level reliability-temperature cycling conditions than that of the RDL-based 3D package in the finite element model (FEM) simulation to a fully top package and 3D package stacked structure.
混合3D封装与RDL和层压板的超薄和高带宽应用
在这项工作中,讨论并展示了一种结合再分配层(RDL)和层压基板层的混合3D封装,用于超薄和高带宽移动应用。这种混合3D封装结构背后的动机是利用高密度RDL层和先进层压板基板层在一个封装中的优势,优化封装在带宽、封装高度、组装制造和封装级别以及板级可靠性方面的特性或性能,以满足每个特定的行业要求。为了演示目的,设计并制造了结合高密度RDL和先进层压基板层的$12.5\ × 12.5-\text{mm}$混合3D封装。在这个演示中,$12.5\times 12.5-\text{mm}$混合3D封装显示$395\ \mu \ mathm {m}$封装高度,包括球栅阵列(BGA)焊料球高度和封装变形$+64\ \mu \ mathm {m}$(哭哭啼啼模式)在25°C和$-81\ \mu \ mathm {m}$(微笑模式)在260°C。演示封装通过了封装级可靠性测试,包括无偏高加速应力测试(uHAST)、温度循环测试(TC)和高温储存测试(HTS)。在全顶封装和3D封装堆叠结构的有限元模型(FEM)仿真中,BGA焊球在板级可靠性-温度循环条件下的蠕变应变能密度(CSED)低于基于rdl的3D封装。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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