Electrochemical Impedance Spectroscopy (EIS) for Monitoring the Water Load on PCBAs Under Cycling Condensing Conditions to Predict Electrochemical Migration Under DC Loads

S. Lauser, T. Richter, Verdingovas Vadimas, R. Ambat
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引用次数: 3

Abstract

Humidity induced failures like metallic dendrite formation are a major problem for automotive electronic components. The harsh environment, where operating conditions in terms of temperature and humidity vary, can repeatedly provoke thin water layers on the surface of Printed Circuit Board Assemblies (PCBAs). The presence of a water film on electronics enables various corrosive processes. The understanding of the film formation and its effects is therefore crucial for assessing the humidity robustness of a specific setup. In this work, we conducted temperature and humidity load experiments with test boards containing interdigitated copper traces of different gap sizes on FR-4 substrate material. We repeatedly provoked condensation and evaporation conditions on the boards' surfaces by temperature cycling between 25 °C and 55 °C at 97 %rH. Electrochemical impedance spectroscopy (EIS) was employed as testing approach to detect the water film formation and respectively its evaporation. An AC excitation of 10 mV over a frequency range between 1 kHz and 100 kHz was used. Simultaneously, the commonly used SIR (Surface Insulation Resistance) test method was conducted at 5 V DC. This method lacks in delivering information on the actual water layer build up, but it detects the growth of dendrites, for which the DC voltage is required. The evaluated results of the EIS testing show, that the magnitude of water present can be depicted by the change in phase shift in the high frequency domain. We could also detect the water film closing for different gap sizes upon condensation. The DC measurements showed a correlation in terms of dendrite formation upon certain water load conditions.
电化学阻抗谱(EIS)监测循环冷凝条件下pcba的水负荷以预测直流负载下的电化学迁移
湿度引起的故障,如金属枝晶的形成,是汽车电子元件的主要问题。恶劣的环境,在温度和湿度方面的操作条件变化,可以反复引发印刷电路板组件(pcba)表面上的薄水层。电子产品上的水膜使各种腐蚀过程成为可能。因此,了解薄膜形成及其影响对于评估特定设置的湿度稳健性至关重要。在这项工作中,我们在FR-4衬底材料上使用含有不同间隙尺寸的交叉铜迹的测试板进行了温度和湿度负载实验。我们通过在97% rH下25°C和55°C之间的温度循环,反复引发电路板表面的冷凝和蒸发条件。采用电化学阻抗谱(EIS)检测水膜的形成和蒸发。在1千赫和100千赫之间的频率范围内,使用10毫伏的交流励磁。同时,在5v DC下进行常用的SIR (Surface Insulation Resistance,表面绝缘电阻)测试方法。这种方法不能提供实际水层形成的信息,但它可以检测到树突的生长,而这需要直流电压。EIS测试的评估结果表明,在高频域中,水的大小可以通过相移的变化来描述。我们还可以检测到不同间隙大小的水膜在凝结过程中的闭合情况。直流测量表明,在一定的水负荷条件下,树突的形成具有相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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