AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments

Byung-Su Kim, H. Won, T. Han, Joon-Sung Yang
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引用次数: 2

Abstract

The optimization of cells and cell combinations used in design is critical to enhance the performance. If frequently used cell combinations are known in advance, a new cell development can be significantly optimized using the cell combinations for chip design. However, extracting frequent cell combinations is an NP hard problem. We propose a new framework, referring as AFSEM, to extract frequent cell combinations for design optimization. To solve this problem, we use a frequent subgraph mining method which is a process of discovering subgraphs. We present an advanced graph modeling and optimized frequent subgraph mining platform for a practical use. The experimental results with various designs demonstrate that the proposed method can discover various types of subcircuits for design optimization with various runtime optimization methods.
先进的频繁子电路提取方法的图挖掘方法优化小区库的发展
优化设计中使用的单元和单元组合对于提高性能至关重要。如果预先知道常用的细胞组合,则可以使用用于芯片设计的细胞组合来显著优化新细胞的开发。然而,频繁细胞组合的提取是一个NP困难问题。我们提出了一个新的框架,称为AFSEM,以提取频繁的细胞组合进行设计优化。为了解决这个问题,我们使用频繁子图挖掘方法,即发现子图的过程。提出了一种先进的图建模和优化的频繁子图挖掘平台。各种设计的实验结果表明,该方法可以利用各种运行时优化方法发现各种类型的子电路进行设计优化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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