David Walker, J. I. Ahuir-Torres, Yasemin Akar, Paul A. Bingham, Xun Chen, Michal Darowski, O. Fähnle, Philippe Gambron, Frankie F. Jackson, Hongyu Li, Luke Mason, Rakesh Mishra, Abdullah Shahjalal, Guoyu Yu
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期刊介绍:
Nanomanufacturing and Metrology is a peer-reviewed, international and interdisciplinary research journal and is the first journal over the world that provides a principal forum for nano-manufacturing and nano-metrology.Nanomanufacturing and Metrology publishes in the forms including original articles, cutting-edge communications, timely review papers, technical reports, and case studies. Special issues devoted to developments in important topics in nano-manufacturing and metrology will be published periodically.Nanomanufacturing and Metrology publishes articles that focus on, but are not limited to, the following areas:• Nano-manufacturing and metrology• Atomic manufacturing and metrology• Micro-manufacturing and metrology• Physics, chemistry, and materials in micro-manufacturing, nano-manufacturing, and atomic manufacturing• Tools and processes for micro-manufacturing, nano-manufacturing and atomic manufacturing