Flux study for ultra fine pitch flip chip packages

W. Lee, G. Lin, D. Chang, J. Jiang, Carl Chen
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引用次数: 9

Abstract

Flux used in 25um ultra fine pitch flip chip attachment process has been found to play an important role in the bump joint and performance. It is commonly used in cleaning the surfaces of solder balls and the surfaces to be soldered to ensure a good wetting of the solder bumps on the substrate pads. Here we use Cu pillar bump with solder cap and substrate pad surface finish is plating tin, and furthermore the standard reflow process was used to perform the evaluation. Due to higher bonding temperature requirement, a Pbfree compatible no clean flux is needed. This kind of flux is formulated to work well with small bump diameter and pitch which have low residual after reflow profile and low weight loss during the whole process. Of course they are achieving compatibility with the underfill. For this new generation flip chip products, how to select a suitable flux is the most challenge. This paper gives a detailed description of the challenges encountered during assembly, such as the flux selection process, flux height study. The characteristics of flux can be determined by using TGA, wet-ability test, and thermal resistance. For ultra fine pitch flip chip application, no clean and low residue flux is the basic demand. Besides, jetting type flux will be the best choice because the flux height is hard to control and the flux amount might not be enough to provide the solder joint ability. Finally, we conclude that the most rigid bonding method, and parameter for fine pitch Cu pillar bump flip chip package.
超细间距倒装芯片封装的通量研究
在25um超细间距倒装芯片的贴装工艺中,焊剂的使用对凹凸接头的性能起着重要的作用。它通常用于清洗焊锡球表面和待焊表面,以确保衬底上的焊锡凸起得到良好润湿。本文采用铜柱凸焊带焊锡帽,衬底垫表面抛光镀锡,并采用标准回流工艺进行评价。由于焊接温度要求较高,因此需要无铅兼容的无清洁焊剂。该助焊剂具有小凸点直径和节距,回流后残余量小,全程重量损失小的特点。当然,他们正在实现与下填料的兼容性。对于这种新一代倒装芯片产品,如何选择合适的磁通是最大的挑战。本文详细介绍了在装配过程中遇到的难题,如焊剂的选择过程、焊剂高度的研究等。通过热重热分析、润湿性测试和热阻测试可以确定助焊剂的特性。对于超细间距倒装芯片应用,无清洁和低残留焊剂是基本要求。此外,喷射型助焊剂的助焊剂高度难以控制,且助焊剂量可能不足以提供焊点的性能,因此是最佳选择。最后,我们得出了最严格的键合方法和参数,用于小间距铜柱碰撞倒装芯片封装。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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