T. Arnold, G. Böhm, R. Fechner, J. Meister, A. Nickel, F. Frost, T. Hänsel, A. Schindler
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引用次数: 147
Abstract
Aspheric reflective optics are becoming more and more important for synchrotron radiation source and X-ray applications. The manufacture of such highly precise optical surfaces requires deterministic ultra-precision machining technologies.
The article focuses on the present status of development of ion beam finishing technology and of atmospheric plasma jet technology in Leibniz Institute of Surface Modification (IOM). The basics of the ion beam and the plasma jet processing technologies and the respective equipment and components developed or being under development for production purposes will be presented together with results on the ion beam figuring (IBF), ion beam smoothing (IBS), and the deep figuring and figure correction using atmospheric plasma jet machining (PJM) technique, respectively. Using IBF and IBS, we achieve nanometer and sub-nanometer accuracies over nearly the entire spectrum of spatial surface wavelength on a variety of materials. PJM technique has been developed to obtain high removal rates especially on silicon-based materials. Removal depths of some 10 μm can easily be achieved.
The article gives an outlook to future activities on developments of the techniques with respect to advanced X-ray optics.
期刊介绍:
Section A of Nuclear Instruments and Methods in Physics Research publishes papers on design, manufacturing and performance of scientific instruments with an emphasis on large scale facilities. This includes the development of particle accelerators, ion sources, beam transport systems and target arrangements as well as the use of secondary phenomena such as synchrotron radiation and free electron lasers. It also includes all types of instrumentation for the detection and spectrometry of radiations from high energy processes and nuclear decays, as well as instrumentation for experiments at nuclear reactors. Specialized electronics for nuclear and other types of spectrometry as well as computerization of measurements and control systems in this area also find their place in the A section.
Theoretical as well as experimental papers are accepted.