New method for piezooptic coefficients measurements based on four-point bending

O. Krupych, V. Savaryn, I. Skab, R. Vlokh
{"title":"New method for piezooptic coefficients measurements based on four-point bending","authors":"O. Krupych, V. Savaryn, I. Skab, R. Vlokh","doi":"10.1109/OMEE.2012.6464797","DOIUrl":null,"url":null,"abstract":"A new technique is suggested for determination of piezooptic coefficients, which represents a combination of digital imaging laser interferometry and a canonical four-point bending method. The design of interferometer, measurement procedures, and data processing are described in detail. Potentials of the present technique are tested on the example of widely used optical borosilicate glass BK7. High enough precision, together with unambiguity in determination of the sign of both piezooptic (πqm) and photoelastic (pqm) coefficients, allow us to claim it to be one of the most accurate and reliable techniques for the measurements of pqm and pqm parameters.","PeriodicalId":6332,"journal":{"name":"2012 IEEE International Conference on Oxide Materials for Electronic Engineering (OMEE)","volume":"16 1","pages":"181-182"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Conference on Oxide Materials for Electronic Engineering (OMEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OMEE.2012.6464797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

A new technique is suggested for determination of piezooptic coefficients, which represents a combination of digital imaging laser interferometry and a canonical four-point bending method. The design of interferometer, measurement procedures, and data processing are described in detail. Potentials of the present technique are tested on the example of widely used optical borosilicate glass BK7. High enough precision, together with unambiguity in determination of the sign of both piezooptic (πqm) and photoelastic (pqm) coefficients, allow us to claim it to be one of the most accurate and reliable techniques for the measurements of pqm and pqm parameters.
基于四点弯曲的压电系数测量新方法
提出了一种将数字成像激光干涉法与标准四点弯曲法相结合的测量压电系数的新方法。详细介绍了干涉仪的设计、测量程序和数据处理。以广泛应用的光学硼硅酸盐玻璃BK7为例,测试了该技术的潜力。该方法具有足够高的精度,在确定π - qm和光弹性系数(pqm)符号时具有明确性,是测量pqm和pqm参数最准确、最可靠的技术之一。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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