The Impact of Na and K on Properties of Cu2ZnSnS4 Thin Films Prepared by Ultrasonic Spray Technique

M. Sekkati, M. Taibi, G. Schmerber, E. Benamar, M. Regragui, F. C. E. Moursli, C. Leuvrey, Z. Edfouf, Z. Sekkat, A. Dinia, A. Slaoui, M. Abd-lefdil
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引用次数: 2

Abstract

CZTS thin films are deposited onto glass and Mo-coated glass substrates by ultrasonic spray technique, followed by a sulfurization under argon atmosphere at 500 °C during 1 h. We have investigated how the addition of the alkali can influence Cu2ZnSnS4 thin films properties. X-ray diffraction and Raman spectroscopy proved that CZTS has the kesterite structure with a preferential orientation along 112. The values of Cu/(Zn+Sn) and (Zn/Sn) ratios, determined by energy dispersive spectroscopy, for undoped CZTS and alkali-doped CZTS are observed to be affected by the alkali doping. The electrical resistivity, for CZTS films deposited on glass substrates, decreased after alkali doping from 9.2 10−1 Ω · cm for undoped CZTS to reach 1.8 10−1 and 4.2 10−1 Ω · cm for 15% content of Na and K, respectively.
Na和K对超声喷涂Cu2ZnSnS4薄膜性能的影响
通过超声波喷涂技术将CZTS薄膜沉积在玻璃和mo涂层玻璃衬底上,然后在500°C氩气气氛下进行1 h的硫化。我们研究了碱的加入对Cu2ZnSnS4薄膜性能的影响。x射线衍射和拉曼光谱证明了CZTS具有112沿优先取向的kesterite结构。用能量色散光谱法测定未掺杂和碱掺杂的CZTS的Cu/(Zn+Sn)和(Zn/Sn)比值受碱掺杂的影响。碱掺杂后,沉积在玻璃基板上的CZTS薄膜的电阻率从未掺杂CZTS的9.2 10−1 Ω·cm降低到Na含量为15%时的1.8 10−1 Ω·cm和K含量为15%时的4.2 10−1 Ω·cm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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