Electrical performance degradation of GaAs solar cells with InGaAs quantum dot layers due to proton irradiation

T. Ohshima, Shin‐ichiro Sato, Tetsuya Nakamura, M. Imaizumi, T. Sugaya, K. Matsubara, S. Niki, A. Takeda, Y. Okano
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引用次数: 2

Abstract

The degradation behaviors of GaAs PiN solar cells with and without quantum dot (QD) layers due to proton irradiation were compared. The GaAs PiN structures either with or without 50 self-aligned In0.4Ga0.6As layers were grown by Molecular Beam Epitaxy (MBE). The QD and non QD solar cells were irradiated with 150 keV and 3 MeV protons, and their electrical performance under AM0 was in-situ measured. Annealing behavior of the electrical characteristics at room temperature was also investigated after the proton irradiation.
质子辐照对具有InGaAs量子点层的GaAs太阳能电池电性能的影响
比较了带量子点层和不带量子点层的GaAs PiN太阳电池在质子辐照下的降解行为。采用分子束外延法(MBE)生长了50个自对准In0.4Ga0.6As层和50个自对准In0.4Ga0.6As层的GaAs PiN结构。用150 keV和3 MeV的质子辐照QD和非QD太阳能电池,并测量了它们在AM0下的电学性能。对质子辐照后的室温退火行为进行了研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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