ICP-MS: Key Steps to Control Contamination and Achieve Low Detection Limits

Abstract

Inductively coupled plasma mass spectrometry (ICP-MS) instruments can perform low-level elemental analysis in a wide range of sample types, from high-purity chemicals to high matrix digests. But achieving consistently low detection limits requires good control of elemental contamination, as well as spectral interferences. A clean working area, careful selection of reagents, and good sample handling techniques are key to successful trace and ultratrace elemental analysis. In this article, we provide five practical tips for controlling contaminants and minimizing detection limits.