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Observability and bad data identfication when using ampere measurements in state estimation

IEEE International Symposium on Circuits and Systems proceedings. IEEE International Symposium on Circuits and Systems Pub Date : 1993-05-03 DOI:10.1109/ISCAS.1993.693241
A. Abur, A. G. Expósito
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在状态估计中使用安培测量时的可观察性和坏数据识别
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来源期刊
IEEE International Symposium on Circuits and Systems proceedings. IEEE International Symposium on Circuits and Systems
IEEE International Symposium on Circuits and Systems proceedings. IEEE International Symposium on Circuits and Systems
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