Seal Rings Toughness Characterization by Numerical and Experimental Approaches

I. Raid, S. Gallois-Garreignot, R. Estevez, V. Coutellier
{"title":"Seal Rings Toughness Characterization by Numerical and Experimental Approaches","authors":"I. Raid, S. Gallois-Garreignot, R. Estevez, V. Coutellier","doi":"10.1109/ECTC.2018.00155","DOIUrl":null,"url":null,"abstract":"We present a device that provides in-situ optical observations of interface delamination along a heterogeneous surface with various interface strengths, namely chips with \"crack stops\" in their perimeters. We adopt a four-point bending test in which a glass plate is used that allows for the optical tracking of the crack advances. Because the interface strength is heterogeneous, drops in the force-displacement curve are observed, corresponding to a non-uniform crack advance. This is confirmed with a 2D finite elements simulation of the four-point bending test; the heterogeneous interface being described with a cohesive model. Results show that the method is reproducible and is able to detect the crack front in a complex interconnect environment. The coupling between force-displacement curve and observations provide insight on the crack propagation sequence. Based on this, some assumptions have been drawn, even if further work investigation is necessary. However, this new experimental approach is seen as a promising method for future characterization of crack growth.","PeriodicalId":6555,"journal":{"name":"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)","volume":"19 1","pages":"1010-1016"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2018.00155","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

We present a device that provides in-situ optical observations of interface delamination along a heterogeneous surface with various interface strengths, namely chips with "crack stops" in their perimeters. We adopt a four-point bending test in which a glass plate is used that allows for the optical tracking of the crack advances. Because the interface strength is heterogeneous, drops in the force-displacement curve are observed, corresponding to a non-uniform crack advance. This is confirmed with a 2D finite elements simulation of the four-point bending test; the heterogeneous interface being described with a cohesive model. Results show that the method is reproducible and is able to detect the crack front in a complex interconnect environment. The coupling between force-displacement curve and observations provide insight on the crack propagation sequence. Based on this, some assumptions have been drawn, even if further work investigation is necessary. However, this new experimental approach is seen as a promising method for future characterization of crack growth.
用数值和实验方法表征密封圈的韧性
我们提出了一种装置,可以沿着具有不同界面强度的非均质表面(即在其周长有“裂纹止点”的芯片)提供界面分层的原位光学观测。我们采用四点弯曲试验,其中使用玻璃板,允许光学跟踪裂纹的进展。由于界面强度是不均匀的,因此观察到力-位移曲线的下降,对应于不均匀的裂纹推进。通过四点弯曲试验的二维有限元模拟验证了这一点;用内聚模型描述异构接口。结果表明,该方法重复性好,能够在复杂的互连环境中检测到裂纹前缘。力-位移曲线与观测值之间的耦合关系提供了对裂纹扩展顺序的认识。在此基础上,提出了一些假设,即使需要进一步的工作调查。然而,这种新的实验方法被认为是未来表征裂纹扩展的一种有前途的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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