Laser drilling and Plasma Cleaning Process for Blind Via Through Mold Interconnect

H. Hsiao, David Soon Wee Ho, Keith Cheng Sing Lim, S. Chong, T. Chai, David Schutzberger, Yariv Oz, Guy Amrani, Jack Q. Zhao, Johnson Toh
{"title":"Laser drilling and Plasma Cleaning Process for Blind Via Through Mold Interconnect","authors":"H. Hsiao, David Soon Wee Ho, Keith Cheng Sing Lim, S. Chong, T. Chai, David Schutzberger, Yariv Oz, Guy Amrani, Jack Q. Zhao, Johnson Toh","doi":"10.1109/EPTC50525.2020.9315051","DOIUrl":null,"url":null,"abstract":"Through Mold Interconnects (TMI) process is currently mainly used in advanced packaging processes. In this research, laser drilling technology is used to fabricate TMI on epoxy mold compound materials with different filling sizes and plasma is used to clean the epoxy residues after laser drilling. The micro-second ultraviolet (UV) laser is used for laser drilling. A punch mode is used to drill blind vias, and different laser beam sizes, fluence and number of pulses were adjusted to achieve blind vias with an aspect ratio of 1:1. The plasma cleaning using CF4/O2 gas chemistry after laser drilling is to use to clean the residual material on the surface of the blind vias.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"28 1","pages":"14-18"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC50525.2020.9315051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Through Mold Interconnects (TMI) process is currently mainly used in advanced packaging processes. In this research, laser drilling technology is used to fabricate TMI on epoxy mold compound materials with different filling sizes and plasma is used to clean the epoxy residues after laser drilling. The micro-second ultraviolet (UV) laser is used for laser drilling. A punch mode is used to drill blind vias, and different laser beam sizes, fluence and number of pulses were adjusted to achieve blind vias with an aspect ratio of 1:1. The plasma cleaning using CF4/O2 gas chemistry after laser drilling is to use to clean the residual material on the surface of the blind vias.
盲通模互连的激光打孔和等离子清洗工艺
通模互连(TMI)工艺目前主要应用于先进的封装工艺。本研究采用激光打孔技术在不同填充尺寸的环氧模复合材料上制备TMI,激光打孔后用等离子体清洗环氧渣。微秒紫外(UV)激光器用于激光钻孔。采用冲孔方式钻取盲孔,通过调整不同的激光束尺寸、能量密度和脉冲数,实现了1:1宽高比的盲孔。激光钻孔后利用CF4/O2气体化学进行等离子清洗是为了清除盲孔表面的残留物质。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信