Xu Meng, U. Kawoos, Shi-Min Huang, M. Tofighi, A. Rosen
{"title":"Implantable wireless devices for the monitoring of intracranial pressure","authors":"Xu Meng, U. Kawoos, Shi-Min Huang, M. Tofighi, A. Rosen","doi":"10.1109/ISCE.2012.6241727","DOIUrl":null,"url":null,"abstract":"The use of intracranial pressure (ICP) monitoring is supported and recommended in the neurosurgical and neurological assessment. Acute and long-term ICP measurement is desirable for providing an insight into the mechanism of the head injury and aiding post neurological disorders treatment. Two different embedded wireless microwave devices for monitoring of ICP have been designed and investigated for research and clinical diagnoses. This paper presents a comparative study of these devices, and describes their main features and measurement procedures.","PeriodicalId":6297,"journal":{"name":"2012 IEEE 16th International Symposium on Consumer Electronics","volume":"32 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 16th International Symposium on Consumer Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCE.2012.6241727","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
The use of intracranial pressure (ICP) monitoring is supported and recommended in the neurosurgical and neurological assessment. Acute and long-term ICP measurement is desirable for providing an insight into the mechanism of the head injury and aiding post neurological disorders treatment. Two different embedded wireless microwave devices for monitoring of ICP have been designed and investigated for research and clinical diagnoses. This paper presents a comparative study of these devices, and describes their main features and measurement procedures.