Proposal of Snubber Circuit to Reduce Problem of Collapsing in BJT due to Overrating

Abstract

The effect on transistors when maximum collector-emitter voltage under condition base is open (vceo), maximum collector-base voltage under condition emitter is open (vcbo), maximum collector-emitter voltage under condition base is shortened (vces) and maximum collector-base voltage under condition emitter is shortened (vcbs) ratings are got exceeded in two circuits are studied by visual analysis, x-ray examination, electrical examination and microscopic examination. This study helps in increasing the reliability of transistor used in all modern electronic equipments. We have proposed here for the implementation of snubber circuit to reduce the problem mentioned above. The results of visual analysis, electrical examination and microscopic examinations is shown in the form of pictures. Our proposal can be implemented in many house appliances, as common people are generally not aware of this fact of transistor ratings so the accidents due to unawareness can be prevented.