Chaobo Shen, Z. Hai, Cong Zhao, Jiawei Zhang, John L. Evans, M. Bozack, J. Suhling
{"title":"Reliability Study and Failure Analysis for Surface Finishes on Sn–Ag–Cu Solder Joints During Thermal Cycling","authors":"Chaobo Shen, Z. Hai, Cong Zhao, Jiawei Zhang, John L. Evans, M. Bozack, J. Suhling","doi":"10.1166/jom.2015.1123","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":38114,"journal":{"name":"International Journal of Mechatronics and Automation","volume":"2 1","pages":"269-275"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Mechatronics and Automation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1166/jom.2015.1123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}