Low-Loss Additively-Deposited Ultra-Short Copper-Paste Interconnections in 3D Antenna-Integrated Packages for 5G and IoT Applications

Abstract

High-bandwidth 5G and 6G communication systems will inevitably migrate to 3D package architectures with backside or embedded dies and antenna-integrated packages for ultra-low losses and smaller footprints. With the trend to such 3D millimeter-wave (mm-wave) packages, the losses from the assembly and through-vias tend to dominate the overall losses. Traditional wirebond and thick solder interconnections lead to large mm-wave interconnect losses that are not acceptable for emerging 5G and 6G communications. This paper focuses on the material syntheses and process development of nanocopper interconnections with ultra-low interconnect losses for chip-last or flip-chip assembly in packages. The first part of the paper introduces the material synthesis of an innovative copper paste with shorter sintering times and temperatures. Optimized conditions are obtained to attain a conductivity of 1.4x10^7 S/m. This is equivalent to 82% increase in conductivity compared to that of solder. The surface roughness is also measured through atomic-force microscopy. Results suggest that the copper paste features higher roughness than that of solders. The second part of this paper discusses the potential of novel nanocopper paste to replace solders as a package assembly material, focusing on the effect of the conductivity and surface roughness with regard to the insertion loss in interconnection bumps. Based on the improved material properties of nanocopper paste, the model shows a 53% reduction in the dB scale at 28 GHz, by employing nanocopper paste. Die shear test for copper paste is also performed to show a high potential to replace solders as a flip-chip assembly material in both printed-circuit-board and mm-wave packaging technologies.