Local structure analysis of Cu(In,Ga)Se 2 by X‐ray fluorescence holography

Abstract

X-ray Fluorescence Holography (XFH) study of Cu(In,Ga)Se2 single crystals has been performed using an inverse mode. Energies of incident X-ray are from 9.2 to 13.2 keV. The Cu-Kα X-ray fluorescence hologram has been constructed, and atomic images were reconstructed using Barton's algorithm. Dependence of fluorescent X-ray, either Cu or Ga, on the reconstructed atomic images of CuIn0.2Ga0.8Se2 was examined. The atomic image of CuIn0.2Ga0.8Se2 was compared with that of CuIn0.8Ga0.2Se2. The reconstructed atomic images of the cation (Cu, Ga, and In) plane and that of the anion (Se) plane are discussed in terms of the alloy composition.