Diffusive base transport in narrow base InP/Ga/sub 0.47/In/sub 0.53/As heterojunction bipolar transistors

D. Ritter, R. Hamm, A. Feygenson, M. Panish, S. Chandrasekhar
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引用次数: 4

Abstract

Summary form only given. The sub-picosecond transit times measured in InP/Ga/sub 0.47/In/sub 0.53/As heterojunction bipolar transistors (HBTs) were widely interpreted in terms of quasi-ballistic base transport. The ballistic transport mechanism, however, is ruled out by the results presented here, which indicate that the common emitter current gain of narrow base InP/Ga/sub 0.47/In/sub 0.53/As HBTs is inversely proportional to the square of the base width, as expected for diffusive base transport.<>
窄基InP/Ga/sub 0.47/ in /sub 0.53/As异质结双极晶体管的扩散基输运
只提供摘要形式。在InP/Ga/sub 0.47/ in /sub 0.53/As异质结双极晶体管(HBTs)中测量的亚皮秒传输时间被广泛地解释为准弹道基输运。然而,本文的结果排除了弹道输运机制,结果表明窄基极InP/Ga/sub 0.47/In/sub 0.53/As的共发射极电流增益与基极宽度的平方成反比,与扩散基极输运的预期一致
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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