Using SiC MOSFETs to improve reliability of EV inverters

Hao Zheng, Xubin Wang, Xuemei Wang, L. Ran, Bo Zhang
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引用次数: 4

Abstract

Wide bandgap semiconductor devices like SiC have achieved more and more attentions in electric vehicles-(EVs) because of their high-temperature capability, high-power density, and high efficiency. As all known, EVs frequently operate in acceleration, deceleration and low speed driving in urban traffic. Thus, not only the rated operation condition should be considered, but also some extreme operation conditions. In order to study the variations of junction temperature of SiC-based MOSFETs comparing with Si-based IGBT of EVs inverter at different operation condition, an electro-thermal coupling model for 3-phase inverter of permanent magnet synchronous motor (PMSM) is used in this paper. Simulation results show that the maximum junction temperatures and junction temperature fluctuations of SiC MOSFETs are quite lower than that of Si IGBTs in all test conditions.
利用SiC mosfet提高EV逆变器的可靠性
SiC等宽禁带半导体器件以其耐高温、高功率密度、高效率等优点在电动汽车领域受到越来越多的关注。众所周知,电动汽车在城市交通中经常进行加、减速和低速行驶。因此,不仅要考虑额定工况,还要考虑一些极端工况。为了研究sic基mosfet和si基IGBT在不同工况下的结温变化规律,建立了永磁同步电机三相逆变器的电热耦合模型。仿真结果表明,在所有测试条件下,SiC mosfet的最大结温和结温波动都远低于Si igbt。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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