M. Danila, M. Miu, T. Ignat, I. Kleps, M. Simion, E. Vasile
{"title":"Microstructural investigation of nanocrystalline FCC metals (Pt, Pt-Fe) embeded into a porous silicon matrix","authors":"M. Danila, M. Miu, T. Ignat, I. Kleps, M. Simion, E. Vasile","doi":"10.1109/SMICND.2008.4703400","DOIUrl":null,"url":null,"abstract":"Porous silicon with different pore sizes and / or densities impregnated with different metallic nanoparticles by various methods and techniques is subject of microstructural investigation by X-ray diffraction, X-ray reflectivity studies and SEM imaging. Crystallite sizes, texture and phase identification is revealed and their use in various applications (biosensors, fuel cell catalyst, etc) is evaluated.","PeriodicalId":6406,"journal":{"name":"2008 IEEE International Conference on Semiconductor Electronics","volume":"33 1","pages":"271-274"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Conference on Semiconductor Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2008.4703400","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Porous silicon with different pore sizes and / or densities impregnated with different metallic nanoparticles by various methods and techniques is subject of microstructural investigation by X-ray diffraction, X-ray reflectivity studies and SEM imaging. Crystallite sizes, texture and phase identification is revealed and their use in various applications (biosensors, fuel cell catalyst, etc) is evaluated.