T. Paulauskas, F. Sen, Cyrus Sun, E. Barnard, Moon J. Kim, Sivananthan Sivalingham, M. Chan, R. Klie
{"title":"Atomic — Scale study of model CdTe grain boundaries","authors":"T. Paulauskas, F. Sen, Cyrus Sun, E. Barnard, Moon J. Kim, Sivananthan Sivalingham, M. Chan, R. Klie","doi":"10.1109/PVSC.2016.7750358","DOIUrl":null,"url":null,"abstract":"Poly-crystalline CdTe-based thin film photovoltaic (PV) devices are the forerunners in commercialized solar cell technology. Despite the commercial success, best laboratory cells achieve ~21.5% power conversion efficiency and hence are still ~10% short of theoretical limit. In this collaborative research project we investigate effects of the grain boundaries via wafer-bonded CdTe bicrystals. Lifetime measurements are carried out using two-photon absorption, while atomic resolution imaging and first-principles calculations are used to correlate the results. Here we present fundamental atomic-scale studies of several model grain boundaries.","PeriodicalId":6524,"journal":{"name":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","volume":"21 1","pages":"3664-3666"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2016.7750358","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Poly-crystalline CdTe-based thin film photovoltaic (PV) devices are the forerunners in commercialized solar cell technology. Despite the commercial success, best laboratory cells achieve ~21.5% power conversion efficiency and hence are still ~10% short of theoretical limit. In this collaborative research project we investigate effects of the grain boundaries via wafer-bonded CdTe bicrystals. Lifetime measurements are carried out using two-photon absorption, while atomic resolution imaging and first-principles calculations are used to correlate the results. Here we present fundamental atomic-scale studies of several model grain boundaries.