{"title":"New tunnel-FET architecture with enhanced ION and improved Miller Effect for energy efficient switching","authors":"A. Biswas, C. Alper, L. De Michielis, A. Ionescu","doi":"10.1109/DRC.2012.6256999","DOIUrl":null,"url":null,"abstract":"Tunneling Field Effect Transistors (TFET) are promising devices to respond to the demanding requirements of future technology nodes. The benefits of the TFETs are linked to their sub-60mV/decade sub-threshold swing, a prerequisite for scaling the supply voltage well below 1V. Main research efforts are currently dedicated to improving the on current (ION) level in a TFET. However, from the circuit point of view the device capacitances are equally important. It is known that the drain-to-gate capacitance in a TFET is almost equal to the gate capacitance in moderate and strong inversion regimes. Due to enhanced Miller Effect, they are known to exhibit large over/undershoot in transient operation as compared to CMOS. Therefore, the effort on improving ION should be simultaneous to an effort of reducing the Miller capacitance (CMILLER). This work proposes a new architecture which addresses both these issues.","PeriodicalId":6808,"journal":{"name":"70th Device Research Conference","volume":"105 1","pages":"131-132"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"70th Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2012.6256999","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
Tunneling Field Effect Transistors (TFET) are promising devices to respond to the demanding requirements of future technology nodes. The benefits of the TFETs are linked to their sub-60mV/decade sub-threshold swing, a prerequisite for scaling the supply voltage well below 1V. Main research efforts are currently dedicated to improving the on current (ION) level in a TFET. However, from the circuit point of view the device capacitances are equally important. It is known that the drain-to-gate capacitance in a TFET is almost equal to the gate capacitance in moderate and strong inversion regimes. Due to enhanced Miller Effect, they are known to exhibit large over/undershoot in transient operation as compared to CMOS. Therefore, the effort on improving ION should be simultaneous to an effort of reducing the Miller capacitance (CMILLER). This work proposes a new architecture which addresses both these issues.
隧道场效应晶体管(ttfet)是一种很有前途的器件,可以响应未来技术节点的苛刻要求。tfet的优势在于其低于60mv / 10的亚阈值摆幅,这是将电源电压降至远低于1V的先决条件。目前主要的研究工作是致力于提高晶体管的on current (ION)水平。然而,从电路的角度来看,器件的电容也同样重要。众所周知,在中等和强反转状态下,TFET的漏极到栅极电容几乎等于栅极电容。由于增强的米勒效应,与CMOS相比,它们在瞬态操作中表现出较大的过冲/欠冲。因此,改善离子的努力应该与降低米勒电容(CMILLER)的努力同时进行。这项工作提出了一个解决这两个问题的新架构。