{"title":"Determination of Temperature-Dependent Carrier Losses in 1.3 μm InGaAsP/InP Double-Heterostructures","authors":"B. Rheinländer, R. Heilmann, G. Oelgart","doi":"10.1002/PSSA.2211060160","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18217,"journal":{"name":"March 16","volume":"2 1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"1988-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"March 16","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/PSSA.2211060160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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