F. Pintacuda, S. Massett, E. Vitanza, M. Muschitiello, V. Cantarella
{"title":"SEGR and PIGS Failure Analysis of SiC Mosfet","authors":"F. Pintacuda, S. Massett, E. Vitanza, M. Muschitiello, V. Cantarella","doi":"10.1109/ESPC.2019.8931999","DOIUrl":null,"url":null,"abstract":"This paper report the Failure Analysis results performed on SiC Mosfet with SEGR and PIGS failure after SEE test. The analysis discovered a hot spot in the SiC junction at the SEGR fail point.","PeriodicalId":6734,"journal":{"name":"2019 European Space Power Conference (ESPC)","volume":"14 4 1","pages":"1-5"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 European Space Power Conference (ESPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESPC.2019.8931999","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
This paper report the Failure Analysis results performed on SiC Mosfet with SEGR and PIGS failure after SEE test. The analysis discovered a hot spot in the SiC junction at the SEGR fail point.
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