Pranav Ambhore, U. Mogera, Boris Vaisband, Ujash Shah, T. Fisher, M. Goorsky, S. Iyer
{"title":"PowerTherm Attach Process for Power Delivery and Heat Extraction in the Silicon-Interconnect Fabric Using Thermocompression Bonding","authors":"Pranav Ambhore, U. Mogera, Boris Vaisband, Ujash Shah, T. Fisher, M. Goorsky, S. Iyer","doi":"10.1109/ECTC.2019.00247","DOIUrl":null,"url":null,"abstract":"High-density placement of dies on the Silicon Interconnect Fabric (Si-IF) demands high power delivery (1 W/mm2) which in turn generates intense heat (~0.5-0.7 W/mm2). To meet this power requirement and manage its thermal dissipation, we have introduced a novel architecture called PowerTherm which involves the attachment of electrically isolated copper terminal blocks to the back side of the Si-IF. The terminal blocks perform a dual function: they deliver high current at mission voltage and cool the Si-IF either passively or actively. This paper deals with PowerTherm bonding process and its characterization. The terminal blocks were attached to electrodeposited Cu on Si using thermocompression bonding in atmospheric conditions, however with confined air flow. Shear strength of ~ 17 MPa was achieved when the bonding was performed at the optimized conditions.","PeriodicalId":6726,"journal":{"name":"2019 IEEE 69th Electronic Components and Technology Conference (ECTC)","volume":"30 1","pages":"1605-1610"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 69th Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2019.00247","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
High-density placement of dies on the Silicon Interconnect Fabric (Si-IF) demands high power delivery (1 W/mm2) which in turn generates intense heat (~0.5-0.7 W/mm2). To meet this power requirement and manage its thermal dissipation, we have introduced a novel architecture called PowerTherm which involves the attachment of electrically isolated copper terminal blocks to the back side of the Si-IF. The terminal blocks perform a dual function: they deliver high current at mission voltage and cool the Si-IF either passively or actively. This paper deals with PowerTherm bonding process and its characterization. The terminal blocks were attached to electrodeposited Cu on Si using thermocompression bonding in atmospheric conditions, however with confined air flow. Shear strength of ~ 17 MPa was achieved when the bonding was performed at the optimized conditions.