An soft error propagation analysis considering logical masking effect on re-convergent path

Shuhei Yoshida, Go Matsukawa, S. Izumi, H. Kawaguchi, M. Yoshimoto
{"title":"An soft error propagation analysis considering logical masking effect on re-convergent path","authors":"Shuhei Yoshida, Go Matsukawa, S. Izumi, H. Kawaguchi, M. Yoshimoto","doi":"10.1109/IOLTS.2016.7604661","DOIUrl":null,"url":null,"abstract":"This paper presents an accurate soft error propagation analysis technique. Especially, we focus on Single Event Upset (SEU) in flip-flop. The proposed technique can calculate the accurate error propagation probability considering logical masking on re-convergent paths with SAT solver efficiently. Experimental result shows that the proposed technique improves the computation time by 94.6% compared with the method with only SAT solver and the accuracy by 93.3% compared with the conventional method respectively.","PeriodicalId":6580,"journal":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"52 1","pages":"13-16"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2016.7604661","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper presents an accurate soft error propagation analysis technique. Especially, we focus on Single Event Upset (SEU) in flip-flop. The proposed technique can calculate the accurate error propagation probability considering logical masking on re-convergent paths with SAT solver efficiently. Experimental result shows that the proposed technique improves the computation time by 94.6% compared with the method with only SAT solver and the accuracy by 93.3% compared with the conventional method respectively.
考虑再收敛路径上逻辑掩蔽效应的软误差传播分析
本文提出了一种精确的软误差传播分析技术。我们特别关注触发器中的单事件干扰(SEU)。该方法考虑了再收敛路径上的逻辑掩蔽,能够有效地计算出精确的误差传播概率。实验结果表明,该方法与仅使用SAT求解器的方法相比,计算时间提高了94.6%;与传统方法相比,计算精度提高了93.3%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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