Improved crystallinity of GaInNAs by additional rapid thermal annealing (RTA)

M. Kondow, T. Kitatani, M. Aoki, S. Nakatsuka, M. Kudo
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引用次数: 2

Abstract

We found that additional RTA at around 750 C greatly increases the photoluminescence (PL) intensity of solid-source MBE grown GaInNAs, while a relatively low in-situ annealing temperature, i.e., growth temperature for the p-Al/sub 0.3/Ga/sub 0.7/As cladding layer, at around 600 C is enough to improve the crystallinity of GaInNAs if additional RTA is performed. Consequently, a 10-Gb/s operation of a GaInNAs edge-emitting laser was achieved above 70 C.
通过附加快速热退火(RTA)改善GaInNAs的结晶度
我们发现,在750℃左右额外的RTA可以大大提高固体源MBE生长GaInNAs的光致发光强度,而在600℃左右相对较低的原位退火温度,即p-Al/sub 0.3/Ga/sub 0.7/As包层的生长温度,则足以提高GaInNAs的结晶度。因此,在70℃以上实现了10gb /s的GaInNAs边缘发射激光器操作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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