{"title":"An on-line test solution for addressing interconnect shorts in on-chip networks","authors":"B. Bhowmik, J. Deka, S. Biswas","doi":"10.1109/IOLTS.2016.7604660","DOIUrl":null,"url":null,"abstract":"This paper presents a scalable time optimized online test solution that addresses short faults in interconnects of an on-chip network (NoC) and observes the deep impact of these faults on NoC performance at large traffics.","PeriodicalId":6580,"journal":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"30 1","pages":"9-12"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2016.7604660","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
This paper presents a scalable time optimized online test solution that addresses short faults in interconnects of an on-chip network (NoC) and observes the deep impact of these faults on NoC performance at large traffics.