Experimental and Theoretical Study on Anisotropic Electron Mobility in 4H‐SiC

R. Ishikawa, Hajime Tanaka, M. Kaneko, T. Kimoto
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Abstract

Electron mobility parallel to the c‐axis in 4H‐SiC is experimentally determined by Hall effect measurements over wide donor density and temperature ranges (6 × 1014–3 × 1018 cm−3 and 140–600 K), and it is compared with that perpendicular to the c‐axis obtained for the same conditions. Empirical equations for the mobility along both directions are determined as functions of donor density and temperature, which contribute to the simulation and designing of SiC devices. The origin of the mobility anisotropy is discussed, focusing on the electron effective mass anisotropy. For a precise analysis, taking into account the effect of electrons at a higher energy region than the conduction band bottom, an average electron effective mass considering the energy distribution is theoretically calculated from the band structure of SiC. As a result, it is clarified that the electron mobility anisotropy including its temperature dependence is explained by the average electron effective mass anisotropy.
4H‐SiC中各向异性电子迁移率的实验与理论研究
在较宽的供体密度和温度范围(6 × 1014-3 × 1018 cm−3和140-600 K)下,通过霍尔效应测量,实验确定了4H‐SiC中平行于c轴的电子迁移率,并将其与相同条件下垂直于c轴的电子迁移率进行了比较。确定了两个方向的迁移率随施主密度和温度的函数的经验方程,为SiC器件的仿真和设计提供了依据。讨论了迁移率各向异性的来源,重点讨论了电子有效质量各向异性。为了进行精确的分析,考虑到电子在比导带底部更高能量区域的影响,从SiC的能带结构理论上计算出考虑能量分布的平均电子有效质量。结果表明,电子迁移率各向异性及其温度依赖性可以用平均电子有效质量各向异性来解释。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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