Study of the Variation of Chromium Oxide and Iron in Oxide Layer by XPS in DSS 2205 with Higher and Lower Chromium Content Due to Ageing for 7000 Hours at 300°C

J. Moreno, C. E. S. Junior
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引用次数: 1

Abstract

The surface oxidation of DSS 2205 duplex stainless steel was studied by X-ray photoelectron spectroscopy (XPS), for two different techniques witch were used to produce thin oxide layers on polished for measuring the concentration of oxide depends on the sputtering profile these duplex stainless steel samples. The experiments were performed in the temperature of 300°C with aging at 7000 hours e with growth of films obtained voltammetric curves (potentiostatically) of the samples in sulfuric acid (H2SO4-0.1M saturated) at low potential. The compositions of the modified oxidized surfaces were determined from the XPS survey scans, and the chemistry of selected elements from the higher-energy-resolution scans of the appropriate peaks. Various Iron/Chromium oxidized layers and various oxide thicknesses were observed and correlated with the temperature. It was found that all the techniques produced oxide layers with various traces of metallic components and with the maximum concentration of chromium oxide and iron oxide in layers close to the oxide layer/metal interface. Therefore this study showed results about the behavior of the DSS 2205 with higher and lower Cr content and that the annealing at 300°C for longer times (7000h) promotes the enrichment of iron oxide, and consequently the decrease in the chromium oxide content, in the oxide surface of both the DSS 2205.
用XPS研究高、低铬DSS 2205在300℃下时效7000小时氧化层中氧化铬和铁的变化
采用x射线光电子能谱(XPS)研究了DSS 2205双相不锈钢的表面氧化,采用两种不同的工艺在抛光表面产生薄的氧化层,并根据样品的溅射轮廓测量氧化浓度。实验温度为300℃,时效时间为7000 h,薄膜生长得到了样品在低电位硫酸(H2SO4-0.1M饱和)中的伏安曲线(恒电位)。改性氧化表面的成分由XPS调查扫描确定,选定元素的化学成分由相应峰的高能量分辨率扫描确定。观察到不同的铁/铬氧化层和不同的氧化层厚度,并与温度相关。结果表明,所有方法制备的氧化层均含有不同痕量的金属成分,氧化铬和氧化铁在靠近氧化层/金属界面的氧化层中浓度最高。因此,本研究得出了DSS 2205在高Cr含量和低Cr含量下的行为,以及300℃较长时间(7000h)退火促进了DSS 2205氧化物表面氧化铁的富集,从而降低了氧化铬的含量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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