Nanoscale Mapping of Semi‐Crystalline Polypropylene

Abstract

We reveal nanoscale information of semi-crystalline polypropylene with the use of a new secondary electron hyperspectral imaging technique. The innovative combination of cryo-SEM and low voltage allows for the optimized imaging of these beam-sensitive materials. Through the collection of secondary electron hyperspectral imaging data, mapping of molecular order on the nano-scale in the scanning electron microscope (SEM) can be achieved.