High Performance Mobile SoC Productization with Second-Generation 10-nm FinFET Technology and Extension to 8-nm Scaling

Jun Yuan, K. Rim, Ying Chen, M. Cai, Youseok Suh, Jihong Choi, Jie Deng, Jerry Bao, Zhimin Song, L. Ge, Hao Wang, Xiao-Yong Wang, Vicki Lin, C. Kuo, Sam Yang, Ashwin Rabindranath, S. Siva, Prasad Bhadri, Sungwon Kim, Kwon Lee, S. Cho, S. Kang, Saechoon Oh, S. Kwon, Xiangdong Chen, P. Pénzes, P. Agashe, W. Miller, P. Chidambaram
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引用次数: 2

Abstract

We report on Snapdragon™ SDM845 mobile SoC in mass production with a second-generation 10-nm finFET technology. SDM845 exhibits 30–40% CPU/GPU performance gain over SDM835 (first-generation 10-nm finFET process) together with ~10% battery life increase driven by new design features and technology improvements in both transistor performance and uniformity, enabling high performance and low power solution for both mobile and computing/AI applications. Extending the technology scaling further, ~15% logic circuit area scaling over 10 nm has been realized in an 8-nm node with gate and BEOL pitch scaling enabled by quadruple patterning (LE^4). Yield equivalence to 10 nm has been demonstrated in 8-nm IP chips.
采用第二代10nm FinFET技术及扩展至8nm制程的高性能移动SoC产品化
我们报告采用第二代10nm finFET技术的Snapdragon™SDM845移动SoC量产。与SDM835(第一代10纳米finFET工艺)相比,SDM845的CPU/GPU性能提高了30-40%,由于新的设计特点和晶体管性能和均匀性的技术改进,电池寿命延长了约10%,为移动和计算/人工智能应用提供了高性能和低功耗的解决方案。进一步扩展该技术的缩放,在8纳米节点上实现了超过10纳米的~15%的逻辑电路面积缩放,并通过四重模式(LE^4)实现了栅极和BEOL间距缩放。在8纳米的IP芯片中已经证明了与10纳米等效的产率。
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