A comparison of copper sulfate and methanesulfonate electrolytes in the copper plating process for through silicon via metallization

H. Wu, S. Lee
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引用次数: 2

Abstract

In this study, authors studied and compared the behaviors of the additives in copper sulfate and cupric methanesulfonate electrolytes by means of electrochemical measurement method with a rotary electrode. The electrochemical parameters including exchange current density and cathodic transfer coefficient of the electrolytes were successfully determined utilizing linear sweep voltammetry. Chronoamperometry (CA) was conducted to verify the diffusion time of additives to the surface of electrodes and the corresponding diffusion constants were characterized. Copper plating of 50/200 μm TSVs was achieved with copper sulfate and cupric methanesulfonate electrolytes respectively. The plated surface morphologies were studied using Scanning Electron Microscopy (SEM).
金属化透硅镀铜工艺中硫酸铜与甲磺酸盐电解质的比较
本文采用旋转电极电化学测量方法,研究并比较了添加剂在硫酸铜和甲磺酸铜电解质中的行为。利用线性扫描伏安法测定了电解液的交换电流密度和阴极传递系数等电化学参数。用计时电流法(CA)验证了添加剂在电极表面的扩散时间,并对相应的扩散常数进行了表征。分别用硫酸铜和甲磺酸铜电解质在50/200 μm tsv表面镀铜。利用扫描电子显微镜(SEM)研究了镀层表面形貌。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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