1700 V full-SiC half-bridge power module with low switching loss

D. Jung, Hyun Gyu Jang, Doohyung Cho, Kunsik Park, Jong-Won Lim, Joung-Hwan Bae, Yun Hwa Choi
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Abstract

A 1700 V/200 A half-bridge power module with silicon carbide (SiC)-based metal-oxide-semiconductor field-effect transistors (MOSFETs) and Schottky barrier diodes (SBDs) was researched and developed. Two direct bonded copper (DBC) substrates are interconnected by copper-based clips with width of 6 mm and thickness of 0.8 mm. The DBC substrate and terminals are interconnected by lead free solder alloy. Static and switching characteristics of the power module were tested. The measured turn-on and turn-off switching energies were 20.15 mJ and 3.98 mJ, respectively. We designed and implemented the evaluation circuit board to measure and extract the stray inductance of the module. The extracted stray inductance of the power module was 13.4 nH. Three reliability tests such as high-temperature storage life (HTSL) of 150°C, temperature humidity bias (THB) of 85°C / 85% RH and thermal cycling (TC) of −65~150°C were evaluated. After the reliability tests, the rate of changes of forward current at the same condition was less than 11.98%.
1700v全sic半桥功率模块,低开关损耗
研制了一种由碳化硅(SiC)基金属氧化物半导体场效应晶体管(mosfet)和肖特基势垒二极管(sdd)组成的1700 V/200 A半桥功率模块。两个直接键合铜(DBC)衬底通过宽度为6mm,厚度为0.8 mm的铜基夹互连。DBC衬底和端子由无铅焊料合金互连。测试了电源模块的静态特性和开关特性。测得的导通和关断能量分别为20.15 mJ和3.98 mJ。设计并实现了模块杂散电感的测量与提取评估电路板。提取的功率模块杂散电感为13.4 nH。对150°C高温贮存寿命(HTSL)、85°C / 85% RH温湿度偏置(THB)和- 65~150°C热循环(TC) 3个可靠性试验进行了评估。经过可靠性试验,在相同工况下,正向电流变化率小于11.98%。
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