Depth profile reconstruction of YCrO3/CaMnO3 superlattices by near total reflection hard x-ray photoelectron spectroscopy

Abstract

We have determined the depth profile of YCrO3/CaMnO3 superlattices by hard x-ray photoemission spectroscopy in near total reflection conditions. YCrO3/CaMnO3 is prone to exhibit interesting magnetotransport properties owing to the large amount of electron transfer expected between Cr3+ and Mn4+. The depth profile was reconstructed by simulating the rocking curves of the different core levels using the YXRO software and fine-tuning the structural model. The results globally conform to scanning transmission electron microscopy and electron energy loss spectroscopy analysis, except for the top layer, whose structure and stoichiometry are found to be preserved in contrast to microscopy.