MEMS Based Particle Size Analyzer Using Electrostatic Measuring Techniques

Sang-Myun Lee, Hong-Lae Kim, H. Kwon, Kyong-Gi Kim, S. Yoo, U. Hong, Jungho Hwang, Yong-Jun Kim
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引用次数: 2

Abstract

This paper reports a MEMS based particle size analyzer using electrostatic measuring techniques. The MEMS based particle size analyzer is able to classify particles of same diameter by using electrical mobility and measure particle size distribution in the size range of 50 to 300 nm. The performance of the proposed device was evaluated through measurements of particle size distribution and compared with commercial high precision instruments.
基于静电测量技术的MEMS粒度分析仪
本文报道了一种基于微机电系统的静电测量粒度分析仪。基于MEMS的粒度分析仪能够利用电迁移率对相同直径的颗粒进行分类,并测量50至300 nm尺寸范围内的粒度分布。该装置的性能通过测量粒度分布进行了评估,并与商用高精度仪器进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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