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Interconnect Electromigration Modeling and Analysis for Nanometer ICs: From Physics to Full-Chip

Q4 Engineering
IPSJ Transactions on System LSI Design Methodology Pub Date : 2020-01-01 DOI:10.2197/ipsjtsldm.13.42
S. Tan, Zeyu Sun, Sheriff Sadiqbatcha
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来源期刊
IPSJ Transactions on System LSI Design Methodology
IPSJ Transactions on System LSI Design Methodology Engineering-Electrical and Electronic Engineering
CiteScore
1.20
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0.00%
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