J. Millán, V. Banu, P. Brosselard, X. Jordà, A. Pérez‐Tomás, P. Godignon
{"title":"Electrical performance at high temperature and surge current of 1.2 kV power rectifiers: Comparison between Si PiN, 4H-SiC Schottky and JBS diodes","authors":"J. Millán, V. Banu, P. Brosselard, X. Jordà, A. Pérez‐Tomás, P. Godignon","doi":"10.1109/SMICND.2008.4703326","DOIUrl":null,"url":null,"abstract":"A comparison between electrical characteristics of 1.2 kV Si-PiN and 4H-SiC Schottky/JBS rectifiers is presented. The 4H-SiC rectifiers were characterized in the 25degC-300degC range, while the Si-PiN was tested up to 200degC due to the Si temperature limitation. 4H-SiC rectifiers exhibited superior temperature performances and their design can be adapted to a specific application. Surge current tests were also performed on both SiC and Si devices.","PeriodicalId":6406,"journal":{"name":"2008 IEEE International Conference on Semiconductor Electronics","volume":"17 1","pages":"53-59"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Conference on Semiconductor Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2008.4703326","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
A comparison between electrical characteristics of 1.2 kV Si-PiN and 4H-SiC Schottky/JBS rectifiers is presented. The 4H-SiC rectifiers were characterized in the 25degC-300degC range, while the Si-PiN was tested up to 200degC due to the Si temperature limitation. 4H-SiC rectifiers exhibited superior temperature performances and their design can be adapted to a specific application. Surge current tests were also performed on both SiC and Si devices.