H. Parikh, J. Vedde, S. Spataru, D. Sera, Gisele A. dos Reis Benatto, P. Poulsen, Claire Mantel, Søren Forchhammer, Michael Larsen, Kenn H. B. Frederiksen
{"title":"A Photovoltaic Module Diagnostic Setup for Lock-in Electroluminescence Imaging","authors":"H. Parikh, J. Vedde, S. Spataru, D. Sera, Gisele A. dos Reis Benatto, P. Poulsen, Claire Mantel, Søren Forchhammer, Michael Larsen, Kenn H. B. Frederiksen","doi":"10.1109/PVSC40753.2019.8981255","DOIUrl":null,"url":null,"abstract":"Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of photovoltaic modules in solar industry application. We propose a diagnostic setup, which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1µs) and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise for developing new light noise removal methods, rotation of panel frame in 3 axes plane for developing perspective distortion correction techniques. The paper also gives an insight of different system and communication delays that affects the performance of overall EL lock-in imaging system integration. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging, which can also be useful for aerial drone imaging of PV plants.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"2014 1","pages":"0538-0543"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC40753.2019.8981255","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of photovoltaic modules in solar industry application. We propose a diagnostic setup, which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1µs) and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise for developing new light noise removal methods, rotation of panel frame in 3 axes plane for developing perspective distortion correction techniques. The paper also gives an insight of different system and communication delays that affects the performance of overall EL lock-in imaging system integration. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging, which can also be useful for aerial drone imaging of PV plants.