{"title":"Combining model development with characterization","authors":"D. Scharfetter, S. Duvall","doi":"10.1109/IEDM.1991.235260","DOIUrl":null,"url":null,"abstract":"The authors demonstrate the advantages of combining model characterization with model development and implementation. Examples cover process and device simulators, compact models for circuit simulators, and statistical models for design verification of IC devices. Situations in which combining model characterization with design could have avoided miscorrelations identified during design verification are discussed.<<ETX>>","PeriodicalId":13885,"journal":{"name":"International Electron Devices Meeting 1991 [Technical Digest]","volume":"153 1","pages":"976-977"},"PeriodicalIF":0.0000,"publicationDate":"1991-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Electron Devices Meeting 1991 [Technical Digest]","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1991.235260","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The authors demonstrate the advantages of combining model characterization with model development and implementation. Examples cover process and device simulators, compact models for circuit simulators, and statistical models for design verification of IC devices. Situations in which combining model characterization with design could have avoided miscorrelations identified during design verification are discussed.<>