Cassiano Rabelo, T. Vasconcelos, B. Archanjo, L. G. Cançado, A. Jorio
{"title":"Micro‐ and Nano‐Raman Spectroscopy Characterization of Exfoliated Graphene with Helium‐Ion Microscope Patterned Line Defects","authors":"Cassiano Rabelo, T. Vasconcelos, B. Archanjo, L. G. Cançado, A. Jorio","doi":"10.1002/pssb.202300204","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":20107,"journal":{"name":"physica status solidi (b)","volume":"5 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"physica status solidi (b)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/pssb.202300204","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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