Raman Spectroscopy for Quantitative Analysis of Point Defects and Defect Clusters in Irradiated Graphite

International Journal of Spectroscopy Pub Date : 2012-02-08 DOI:10.1155/2012/197609

K. Niwase

引用次数: 36

Abstract

We report the development of Raman spectroscopy as a powerful tool for quantitative analysis of point defect and defect clusters in irradiated graphite. Highly oriented pyrolytic graphite (HOPG) was irradiated by 25 keV He

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辐照石墨中点缺陷和缺陷团簇的拉曼光谱定量分析

我们报告了拉曼光谱的发展，作为一个强大的工具，定量分析点缺陷和缺陷团簇辐照石墨。采用25kev He辐照高取向热解石墨(HOPG)

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

International Journal of Spectroscopy

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