FE-SEM Characterization of Some Nanomaterial

Abstract

In 1931 Max Knoll and Ernst Ruska at the university of Berlin built the first electron microscope that use accelerated electrons as a source instead of light source. However, the first scanning electron microscope (SEM) was built in 1938 due to the difficulties of scanning the electrons through the sample. Electron microscope is working exactly the same as the optical microscope expects it use a focused accelerated electron beam [1].