Uranium Particle Identification with SEM-EDX for Isotopic Analysis by Secondary Ion Mass Spectrometry

IF 0.4 Q4 SPECTROSCOPY
F. Esaka, M. Magara
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引用次数: 4

Abstract

: Secondary ion mass spectrometry (SIMS) is a promising tool to measure isotope ratios of individual uranium particles in environmental samples for nuclear safeguards. However, the analysis requires prior identification of a small number of uranium particles that coexist with a large number of other particles without uranium. In the present study, this identification was performed by scanning electron microscopy - energy dispersive X-ray analysis with automated particle search mode. The analytical results for an environmental sample taken at a nuclear facility indicated that the observation of backscattered electron images with × 1000 magnification was appropriate to efficiently identify uranium particles. Lower magnification (less than × 500) made it difficult to detect smaller particles of approximately 1 µ m diameter. After identification, each particle was manipulated and transferred for subsequent isotope ratio analysis by SIMS. Consequently, the isotope ratios of individual uranium particles were successfully determined without any molecular ion interference. It was demonstrated that the proposed technique provides a powerful tool to measure individual particles not only for nuclear safeguards but also for environmental sciences.
二次离子质谱法鉴定铀粒子的SEM-EDX
次级离子质谱法(SIMS)是一种很有前途的工具,用于测量核保障环境样品中单个铀颗粒的同位素比率。但是,分析需要事先鉴定与大量其他无铀粒子共存的少量铀粒子。在本研究中,通过扫描电子显微镜-自动粒子搜索模式的能量色散x射线分析来进行这种鉴定。对某核设施环境样品的分析结果表明,观察× 1000倍放大的背散射电子图像可以有效地识别铀颗粒。较低的放大倍率(小于× 500)使得检测直径约为1 μ m的较小颗粒变得困难。鉴定后,每个粒子被处理并转移到随后的SIMS同位素比率分析。因此,在没有任何分子离子干扰的情况下,成功地确定了单个铀粒子的同位素比率。结果表明,所提出的技术不仅为核安全保障,而且为环境科学提供了测量单个粒子的有力工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
0.90
自引率
20.00%
发文量
0
审稿时长
6 weeks
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