D. Kot, G. Kissinger, M. Schubert, S. Marschmeyer, G. Schwalb, A. Sattler
{"title":"Characterization of Nanometer‐Sized Oxygen Precipitates in Highly B‐Doped Czochralski Silicon","authors":"D. Kot, G. Kissinger, M. Schubert, S. Marschmeyer, G. Schwalb, A. Sattler","doi":"10.1002/PSSC.201700161","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"23 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physica Status Solidi (c)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/PSSC.201700161","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
